SEMI International Standards Meetings
Day 2
Wednesday, November 11 | 9:00 am - 3:00 pm
ICM (Internationales Congress Center München)
Meetings:
For the complete three-day meeting schedule, click HERE.
| Int'l Advanced Surface Inspection (TF) | 9:00 am - 10:00 am | ICM | |
| Int'l Test Methods (TF) | 10:00 am - 11:00 am | ICM | |
| Int'l Polished Wafer (TF) | 11:00 am - 12:00 pm | ICM | |
| (By Invitation Only)Silicon Wafer GCS | 12:00 pm - 1:00 pm | ICM | |
| Int'l Advanced Wafer Geometry (TF) | 1:00 pm - 3:00 pm | ICM | |
*Please note that the times and agenda are subject to change.
Note:
- You must be a SEMI Standards Program Member to participate in the meetings. Membership is FREE!
- Complete the Application Form today to become a Standards Member.
For any questions, please contact Kevin Nguyen, International Standards Operations Manager.